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- Using multi-method analysis to identify challenging paper machine deposits and defects, TAPPI Journal March 2025
Using multi-method analysis to identify challenging paper machine deposits and defects, TAPPI Journal March 2025
March 23, 2025
Application: This paper discusses how the use of multiple analytical techniques can work in concert to help troubleshoot challenging paper machine deposits and defects.
Author: Matthew A. Blazey, Margaret A. Gillan, Jessica M. Reichert, and Kathryn A. Smith
ABSTRACT: Based on its speed and versatility, Fourier transform infrared (FTIR) spectroscopy is the industry’s common starting point for analysis of a paper machine deposit or defect sample. However, certain contaminants and papermaking process additives cannot be precisely identified solely by infrared spectral interpretation. This lack of specificity could lead to a misinterpretation of the composition of the deposit or defect. A multi-method analysis uses data from two or more analytical techniques, including FTIR spectroscopy, microbiological staining/phase contrast microscopy, pyrolysis-gas chromatography/mass spectrometry (Pyro-GC/MS), and scanning electron microscopy-energy dispersive X-ray spectroscopy (SEM-EDX), to produce a more specific assessment of a sample’s composition. This paper discusses the use of a multi-method analysis in deposit and defect analysis and presents several case studies that demonstrate how this comprehensive approach can often produce an interpretation result of greater conviction and value to the papermaker.
Post Tags
- Analytical Techniques
- Defect Analysis
- Deposit Identification
- FTIR Spectroscopy
- Laboratory Analysis
- Mill Troubleshooting Techniques
- Multi-Method Analysis
- Paper Defect Investigation
- Paper Machine Deposits
- Paper Manufacturing
- Paper Mill Maintenance
- Paper Production Technology
- Paper Quality Control
- Process Control Systems
- Process Optimization Workshops
- Process Troubleshooting
- Pyrolysis-GC/MS
- Quality Control In Paper Mills
- SEM-EDX Analysis
- Spectroscopic Analysis show moreshow less
